AFM Probes, Tips, and Cantilevers

Тип предложения / Предлагаю продукцию, услугу

Our standard AFM probes offer a wide range of scanning modes, resonant frequencies, force constants, and coating options suitable for all your AFM research needs.

The cantilever is a key element of any scanning probe microscope, the properties and quality of which depends on the successful operation of the microscope in General. This is the basic measuring element of many types of probe microscopes. The right choice of the cantilever is one of the most important conditions for obtaining good AFM images.